The 1st International Workshop on Gallium Oxide and Related Materials 2015, Young Researcher Award,Comparative Study on Thermal Stability of Group-III Oxides
Japanese Journal of Applied Physics 52 08JD05-1-08JD05-4 2013年5月 [査読有り]
The influence of the source gas supply sequence prior to growth and the NH3 input partial pressure (PoNH3) on the nucleation of InN islands during the initial stages of hydride vapor phase epitaxy on a nitrided (0001) sapphire substrate was invest...
Japanese Journal of Applied Physics 52 08JB10-1-08JB10-4 2013年5月 [査読有り]
Orientation dependent decomposition of sapphire substrates and resultant AlN formation during heat treatment in an atmospheric-pressure mixedgas flow of H2 and N2 was investigated within the temperature range 980–1480 oC. AlN was formed on sapphir...
H. C. Cho   R. Togashi   H. Murakami   Y. Kumagai   A. Koukitu   
JOURNAL OF CRYSTAL GROWTH 367 122-125 2013年3月 [査読有り]
In this report, effects of ammonia nitridation and low temperature InN buffer growth were investigated to improve the crystalline quality of InN(10 (1) over bar3) grown on GaAs(110) by metalorganic vapor phase epitaxy (MOVPE). InN(10 (1) over bar3...
JOURNAL OF CRYSTAL GROWTH 360 197-200 2012年12月 [査読有り]
AlN layers were grown on (0001) sapphire substrates by hydride vapor phase epitaxy (HVPE) at 1100 degrees C with a source gas supply sequence of (1) NH3 preflow or (2) AlCl3 preflow. An Al-polarity AlN layer without inclusion of a N-polarity regio...
JOURNAL OF CRYSTAL GROWTH 350(1) 60-65 2012年7月 [査読有り]
Heat treatment of (0001) sapphire substrates in the temperature range 980-1480 degrees C was investigated in an atmospheric-pressure mixed flow of H-2 and N-2 for various molar fractions of H-2 (F degrees=H-2/(H-2+ N-2)). At 1330 degrees C, AIN wh...